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SNJ54BCT8240AFK datasheet



datasheet for SNJ54BCT8240AFK by Texas Instruments   Electronic component partname: SNJ54BCT8240AFK

SNJ54BCT8240AFK description: SCAN TEST DEVICES WITH OCTAL BUFFERS

Manufacturer: Texas Instruments

Temperature range: Min: -55°C | Max: 125°C

Chip package & pins: FK (Pins: 28)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SNJ54BCT8240AFK datasheet size: 293Kb

Download SNJ54BCT8240AFK datasheet: SNJ54BCT8240AFK.PDF


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