SNJ54BCT8240AFK datasheet

datasheet for SNJ54BCT8240AFK by Texas Instruments

Electronic component partname: SNJ54BCT8240AFK

SNJ54BCT8240AFK description: SCAN TEST DEVICES WITH OCTAL BUFFERS

Manufacturer: Texas Instruments

Temperature range: Min: -55°C | Max: 125°C

Chip package & pins: FK (Pins: 28)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SNJ54BCT8240AFK datasheet size: 293Kb

Download SNJ54BCT8240AFK datasheet: SNJ54BCT8240AFK.PDF