SN74BCT8240ADWR datasheet

datasheet for SN74BCT8240ADWR by Texas Instruments

Electronic component partname: SN74BCT8240ADWR

SN74BCT8240ADWR description: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL INVERTING BUFFERS

Manufacturer: Texas Instruments

Temperature range: Min: 0°C | Max: 70°C

Chip package & pins: DW (Pins: 24)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SN74BCT8240ADWR datasheet size: 293Kb

Download SN74BCT8240ADWR datasheet: SN74BCT8240ADWR.PDF