SN74BCT8373ADWR datasheet

datasheet for SN74BCT8373ADWR by Texas Instruments

Electronic component partname: SN74BCT8373ADWR

SN74BCT8373ADWR description: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES

Manufacturer: Texas Instruments

Temperature range: Min: 0°C | Max: 70°C

Chip package & pins: DW (Pins: 24)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SN74BCT8373ADWR datasheet size: 294Kb

Download SN74BCT8373ADWR datasheet: SN74BCT8373ADWR.PDF