SN74BCT8374ADWR datasheet

datasheet for SN74BCT8374ADWR by Texas Instruments

Electronic component partname: SN74BCT8374ADWR

SN74BCT8374ADWR description: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS

Manufacturer: Texas Instruments

Temperature range: Min: 0°C | Max: 70°C

Chip package & pins: DW (Pins: 24)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SN74BCT8374ADWR datasheet size: 294Kb

Download SN74BCT8374ADWR datasheet: SN74BCT8374ADWR.PDF