SN74LVTH182512DGGR datasheet

datasheet for SN74LVTH182512DGGR by Texas Instruments

Electronic component partname: SN74LVTH182512DGGR

SN74LVTH182512DGGR description: 3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS

Manufacturer: Texas Instruments

Temperature range: Min: -40°C | Max: 85°C

Chip package & pins: DGG (Pins: 64)

Datasheet file format: PDF (Requires Adobe Acrobat Reader)

SN74LVTH182512DGGR datasheet size: 518Kb

Download SN74LVTH182512DGGR datasheet: SN74LVTH182512DGGR.PDF